Quo Vadis, Elimination Voltammetry?
The publication is dedicated to Prof. RNDr. Jiří Barek, CSc. on the occasion of his jubilee
DOI:
https://doi.org/10.54779/chl20240520Keywords:
elimination voltammetry with linear scan (EVLS), diffusion, capacitive and kinetic current components, elimination functions, EVLS peak-counterpeak, EVLS application, EVLS paradigmsAbstract
The article presents an open personal approach to the future of elimination voltammetry with linear scan (EVLS) in the context of the expected development and research of new materials and new technologies. With this development, the application capability of EVLS will be expanded, the basis of which is a mathematical apparatus that allows some current components to be eliminated from the overall voltammetric record, while others to be preserved. Although EVLS played a provisional and unquestionable role in electroanalytical applications, where it helped to obtain lower limits of detection (LOD) values of various organic and inorganic substances and to reveal electrode processes hidden in voltammetric signals, its further development indicates promising use in other research areas as well. The aim of the communication is a more precise but also more general definition of the elimination method, its specific paradigms, prospects and goals for the future.